The following is an
archive of recent Teseda news items and press releases.
NOTE: You will need Acrobat Reader to view PDF files.
Teseda Corporation
Launches and Ships SecureXY™
Second Product Offering in the Diagnostic Manager Tool Suite
Portland, Ore. — July 16, 2007 —
Teseda Corporation, a leading provider of comprehensive scan-based
diagnostic and debug solutions for high yield silicon production, is
now shipping the SecureXY™ product. SecureXY™, a powerful
yield-enhancement tool, enables the sharing and analysis of pertinent
failure information in the physical domain without compromising the
design IP.
SecureXY™ works in conjunction with
ScanXY™, the first tool in the Diagnostic Manager Suite.
ScanXY™ takes scan failure information and design information and
is able to present failure data in a Physical die view showing failing
scan cells, failing scan chains, and XY location data. SecureXY™
is able to take the ScanXY™ data, and present it as an XY view
while protecting sensitive design IP information
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Teseda Corporation
Launches ScanXY™
First Phase of the Diagnostic Manager Series Product Group
Portland, Ore. — June 25, 2007 —
Teseda Corporation, a leading provider of comprehensive scan-based
diagnostic and debug solutions for high yield silicon production, is
pleased to announce ScanXY™, the first in the Teseda Diagnostic
Manager Series software products. After its initial release to key
customers, ScanXY™ is now available to the general market.
ScanXY™ allows engineers to quickly
link structural test data mismatches to their physical domains. The
viewing capabilities of ScanXY™ show the XY location where test
failures and subsequent "hot spots" are taking place. ScanXY™
runs without third party intervention, either independently or in
conjunction with the Teseda WorkBench™ (TWB) software.
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